The processes of formation of nanoscale silicide films during the implantation of Ba+ ions into Si (111) and Si (100) and subsequent thermal annealing were studied by electron spectroscopy. It is shown that implantation of ions with a high dose D > 1016 cm-2 and short-term heating leads to the formation of thin films of barium monosilicide with new surface superstructures. The optimal modes of formation and band-energy parameters of BaSi films obtained by low-energy high-dose implantation of barium ions in Si are determined. It is shown that BaSi films are a narrow-gap semiconductor with a band gap of 0.7 eV and have good emission and thermoelectric properties corresponding to the solar spectrum and have high photoelectric and thermoelectric characteristics. It should be noted that, in addition to the formation of a chemical compound, the narrowing of the Si band gap upon implantation of large doses of Ba+ ions also contributes to defects formed as a result of strong disordering of the crystal lattice.
Published in | American Journal of Nano Research and Applications (Volume 9, Issue 4) |
DOI | 10.11648/j.nano.20210904.11 |
Page(s) | 32-35 |
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This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited. |
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Low-Energy High-Dose Ion Implantation, Films of Barium Monosilicide, Optimal Modes of Film Formation, Energy-Band Parameters
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APA Style
Gunel Imanova, Ilkhom Bekpulatov. (2022). Investigation on the Electronic Structure of Nanosized Barium Monosilicide Films Produced by Low-energy Implantation of Ba+ Ions in Si. American Journal of Nano Research and Applications, 9(4), 32-35. https://doi.org/10.11648/j.nano.20210904.11
ACS Style
Gunel Imanova; Ilkhom Bekpulatov. Investigation on the Electronic Structure of Nanosized Barium Monosilicide Films Produced by Low-energy Implantation of Ba+ Ions in Si. Am. J. Nano Res. Appl. 2022, 9(4), 32-35. doi: 10.11648/j.nano.20210904.11
AMA Style
Gunel Imanova, Ilkhom Bekpulatov. Investigation on the Electronic Structure of Nanosized Barium Monosilicide Films Produced by Low-energy Implantation of Ba+ Ions in Si. Am J Nano Res Appl. 2022;9(4):32-35. doi: 10.11648/j.nano.20210904.11
@article{10.11648/j.nano.20210904.11, author = {Gunel Imanova and Ilkhom Bekpulatov}, title = {Investigation on the Electronic Structure of Nanosized Barium Monosilicide Films Produced by Low-energy Implantation of Ba+ Ions in Si}, journal = {American Journal of Nano Research and Applications}, volume = {9}, number = {4}, pages = {32-35}, doi = {10.11648/j.nano.20210904.11}, url = {https://doi.org/10.11648/j.nano.20210904.11}, eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.nano.20210904.11}, abstract = {The processes of formation of nanoscale silicide films during the implantation of Ba+ ions into Si (111) and Si (100) and subsequent thermal annealing were studied by electron spectroscopy. It is shown that implantation of ions with a high dose D > 1016 cm-2 and short-term heating leads to the formation of thin films of barium monosilicide with new surface superstructures. The optimal modes of formation and band-energy parameters of BaSi films obtained by low-energy high-dose implantation of barium ions in Si are determined. It is shown that BaSi films are a narrow-gap semiconductor with a band gap of 0.7 eV and have good emission and thermoelectric properties corresponding to the solar spectrum and have high photoelectric and thermoelectric characteristics. It should be noted that, in addition to the formation of a chemical compound, the narrowing of the Si band gap upon implantation of large doses of Ba+ ions also contributes to defects formed as a result of strong disordering of the crystal lattice.}, year = {2022} }
TY - JOUR T1 - Investigation on the Electronic Structure of Nanosized Barium Monosilicide Films Produced by Low-energy Implantation of Ba+ Ions in Si AU - Gunel Imanova AU - Ilkhom Bekpulatov Y1 - 2022/03/09 PY - 2022 N1 - https://doi.org/10.11648/j.nano.20210904.11 DO - 10.11648/j.nano.20210904.11 T2 - American Journal of Nano Research and Applications JF - American Journal of Nano Research and Applications JO - American Journal of Nano Research and Applications SP - 32 EP - 35 PB - Science Publishing Group SN - 2575-3738 UR - https://doi.org/10.11648/j.nano.20210904.11 AB - The processes of formation of nanoscale silicide films during the implantation of Ba+ ions into Si (111) and Si (100) and subsequent thermal annealing were studied by electron spectroscopy. It is shown that implantation of ions with a high dose D > 1016 cm-2 and short-term heating leads to the formation of thin films of barium monosilicide with new surface superstructures. The optimal modes of formation and band-energy parameters of BaSi films obtained by low-energy high-dose implantation of barium ions in Si are determined. It is shown that BaSi films are a narrow-gap semiconductor with a band gap of 0.7 eV and have good emission and thermoelectric properties corresponding to the solar spectrum and have high photoelectric and thermoelectric characteristics. It should be noted that, in addition to the formation of a chemical compound, the narrowing of the Si band gap upon implantation of large doses of Ba+ ions also contributes to defects formed as a result of strong disordering of the crystal lattice. VL - 9 IS - 4 ER -